Physical Measurement and Analysis of Thin Films
Physical Measurement and Analysis of Thin Films | Livres anciens et modernes | Murt, E.M., Guldner, W.G., Ed.
Livres anciens et modernes
Murt, E.M., Guldner, W.G., Ed.
Plenum Publishing,
1969
Physical Measurement and Analysis of Thin Films
Physical Measurement and Analysis of Thin Films | Livres anciens et modernes | Murt, E.M., Guldner, W.G., Ed.
Livres anciens et modernes
Murt, E.M., Guldner, W.G., Ed.
Plenum Publishing,
1969
18,80 €
(Lexington,
États-Unis d'Amérique)
Mode de Paiement
- PayPal
- Carte bancaire
- Virement bancaire
- Pubblica amministrazione
- Carta del Docente
Détails
- Année
- 1969
- Lieu d'édition
- New York
- Auteur
- Murt, E.M., Guldner, W.G., Ed.
- Éditeurs
- Plenum Publishing
- Format
- 23.75 cm.
- Edition
- First Edition
- Thème
- Science
- Etat de conservation
- En bonne condition
- Langues
- Anglais
- Reliure
- Couverture rigide
- Premiére Edition
- True
Description
- Hardcover, good condition, w. ltly compressed spine. badly bumped r. top corner, 3 ltly bumped corners. Damp stain on r. brd. Creaky fr. hinge. Ltly tanned p. edges, eps. clean, tight, unmarked. Dj good, some lt soil, somewhat rubbed. Ltly tanned sp. da
ISBN: B000FML0N4
