Physical Measurement and Analysis of Thin Films
Physical Measurement and Analysis of Thin Films | Rare and modern books | Murt, E.M., Guldner, W.G., Ed.
Rare and modern books
Murt, E.M., Guldner, W.G., Ed.
Plenum Publishing,
1969
Physical Measurement and Analysis of Thin Films
Physical Measurement and Analysis of Thin Films | Rare and modern books | Murt, E.M., Guldner, W.G., Ed.
Rare and modern books
Murt, E.M., Guldner, W.G., Ed.
Plenum Publishing,
1969
18.80 €
(Lexington,
United States of America)
Payment methods
- PayPal
- Credit card
- Bank transfer
- Pubblica amministrazione
- Carta del Docente
Details
- Year of publication
- 1969
- Place of printing
- New York
- Author
- Murt, E.M., Guldner, W.G., Ed.
- Publishers
- Plenum Publishing
- Size
- 23.75 cm.
- Edition
- First Edition
- Keyword
- Science
- State of preservation
- Good
- Languages
- English
- Binding
- Hardcover
- First edition
- True
Description
- Hardcover, good condition, w. ltly compressed spine. badly bumped r. top corner, 3 ltly bumped corners. Damp stain on r. brd. Creaky fr. hinge. Ltly tanned p. edges, eps. clean, tight, unmarked. Dj good, some lt soil, somewhat rubbed. Ltly tanned sp. da
ISBN: B000FML0N4
